Analysis of methylation-sensitive amplified polymorphism in wheat genome under the wheat leaf rust stress
FU Sheng-Jie1, 3;WANG Hui2;FENG Li-Na1;SUN Yi;YANG Wen-Xiang1;LIU Da-Qun1
1. Department of Plant Pathology, College of Plant Protection, Agricultural University of Hebei, Biological Control Center for Plant Dis-eases and Plant Pests of Hebei Provinec, Baoding 071001, China; 2. Jining Medical College, Jining 272013, China; 3. Liangshan Agricultural Office of Shandong Province, Liangshan 272600, China
FU Sheng-Jie, WANG Hui, FENG Li-Na, SUN Yi, YANG Wen-Xiang, LIU Da-Qun. Analysis of methylation-sensitive amplified polymorphism in wheat genome under the wheat leaf rust stress[J]. HEREDITAS, 2009, 31(3): 297-304.